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January 23, 2013
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NYPD prepare to 'scan and frisk'

A new high-tech scanner will take the patting down policy out of 'stop and frisk'

By PoliceOne Staff

NEW YORK — The NYPD is preparing to deploy a scanner that tests for terahertz—a natural energy—that will allow police to view concealed weapons from a distance.

Police Commissioner Ray Kelly announced Wednesday that this new technology will replace the controversial pat-down policy, according to NY Daily News.

“If something is obstructing the flow of that radiation, for example a weapon, the device will highlight that object,” Kelly said.

The device, which is small enough to be kept in a police vehicle or stationed on a street corner, will begin testing the device on the street, according to the article.

“We still have a number of trials to run before we can determine how best to deploy this technology. We’re also talking to our legal staff about this. But we’re very pleased with the progress we’ve made over the past year,” said Kelly.






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